The Microscopy Society of Canada Ontario Student Chapter is hosting an online career event Monday, April 3rd, 5:30 to 6:45 p.m. “Finding Your Path In Microscopy” is a virtual career panel that will feature microscopists currently working in industry, with the goal of highlighting career stories and opportunities for young microscopist trainees.
Panelists include:
Mark Salomons – National Research Council Canada
Robert Mcleod – Hitachi High-Tech Canada Inc.
Mouhanad Babi – Centre for Advanced Light Microscopy
John-Michael Arpino – Nikon Instruments
Sandra Gibson – Quantum Nanofabrication and Characterization Facility
If you are interested in attending, please register for free at the following link: https://uoft.me/FYPM2023.
CMC Microsystems is a not-for-profit organization accelerating research and innovation in advanced technologies.
OCCAM recently joined a network of Canadian open-access user facilities participating in CMC Microsystems’ micro-nanotechnologies (MNT) program. The MNT program provides financial assistance for custom microfabrication projects at open-access university facilities across Canada. Program eligibility extends to characterization work of the type in which OCCAM specializes. Details of the program are available here.
State-of-the-art SU7000 Ultra-high resolution scanning electron microscope installed in OCCAM’s Pratt laboratories.
A new Hitachi SU7000 FE-SEM instrument was recently installed in OCCAM. The ultra-high resolution variable pressure Schottky FE-SEM was purchased with a CFI-JELF awarded to Prof. J. Howe. The new instrument complements existing instrumentation within OCCAM and provides a key platform for development of new technologies and methodologies for in-situ characterization.
The SU7000’s optics and detector design, augmented by variable pressure capabilities, make it a highly capable and flexible tool for a wide variety of characterization modes and sample types. The instrument will eventually be equipped with energy dispersive x-ray analysis (EDX), electron backscatter diffraction (EBSD), and scanning transmission (STEM) capabilities.
The instrument will be available for applications work starting mid-November/2021. Hands-on user training will commence as soon as the public health situation allows.
Hitachi High Technologies Canada , and strong and long-time partner of OCCAM, has been recognized for their profound and persistent contributions to leading-edge research and training at the University of Toronto.
Professor Ian Gilmore visited OCCAM and the Department of Chemical Engineering & Applied Chemistry to deliver an invited talk as part of the Lectures at the Leading Edge seminar series. Prof. Gilmore is Head of Science at the National Physical Laboratory (NPL). Slides from his talk, “Metabolic Imaging at the Single-cell Scale: Recent Advances and Future Challenges in Mass Spectrometry Imaging” can be found here.
The Ontario Centre for the Characterization of Advanced Materials (OCCAM) – a $20 million analytical laboratory at U of T’s Faculty of Applied Science & Engineering – has officially unveiled its newest machines and is ready to take on new industrial partnerships.
University of Toronto’s new $20M materials characterization facility opened the first phase of the operation with an afternoon of celebrations, talks, and tours. See the full story here.
