Scanning Auger Nanoprobe

(PHI 710 Scanning Auger NanoProbe)

Physical Electronics 710 Scanning Auger Nanoprobe

High lateral spatial resolution and high depth resolution quantitative elemental and chemical state information.

Key Functionalities

  • quantitative elemental and chemical state characterization
  • variable spot-size and multiple-area electron spectroscopy
  • high spatial resolution secondary electron imaging
  • high spatial resolution surface-specific elemental and chemical state mapping
  • high resolution depth profiling (variable spot size, including point)
Auger-SEI
Auger-spectra
Auger-imaging
AES-depthprofile
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Key Configuration Parameters

  • cylindrical mirror analyzer
  • co-axially mounted Schottky field emission electron source (1-25 keV)
  • motorized 5-axis precision specimen stage
  • 5 kV floating column Ar ion source (surface cleaning, depth profiling, charge neutralization)
  • 60 mm specimen load-lock and introduction

For more information, contact Peter Brodersen.

Open Centre for the Characterisation of Advanced Materials