A new Hitachi SU7000 FE-SEM instrument was recently installed in OCCAM. The ultra-high resolution variable pressure Schottky FE-SEM was purchased with a CFI-JELF awarded to Prof. J. Howe. The new instrument complements existing instrumentation within OCCAM and provides a key platform for development of new technologies and methodologies for in-situ characterization.

The SU7000’s optics and detector design, augmented by variable pressure capabilities, make it a highly capable and flexible tool for a wide variety of characterization modes and sample types. The instrument will eventually be equipped with energy dispersive x-ray analysis (EDX), electron backscatter diffraction (EBSD), and scanning transmission (STEM) capabilities.

The instrument will be available for applications work starting mid-November/2021. Hands-on user training will commence as soon as the public health situation allows.