Scanning Electron Microscope
Hitachi SU3500 Scanning Electron Microscope
High resolution imaging, structural and compositional analysis
Key Functionalities
•High resolution imaging, structural and compositional analysis
•Engineered to support analysis of a wide range of samples
•Simultaneous imaging with backscattered electron, secondary electron, and ultra variable-pressure (in VP mode) detectors
•Variable-pressure operation allows for image observation and analysis of insulators
•Energy dispersive x-ray (EDX) analysis and electron backscatter diffraction (EBSD) analysis
•Intuitive, user-friendly SEM interface for straightforward operation
Key Configuration Parameters
•multi-detector configuration; secondary, backscattered, and ultra-variable pressure detectors
•Thermionic W emitter
•0.3-30 keV accelerating voltage
•6-650 Pa variable pressure range
