Scanning Electron Microscope

Hitachi TM3030 Scanning Electron Microscope

High-resolution surface imaging

Key Functionalities

•Fast, low-barrier, high-quality electron microscopy

•Flexible characterization with large magnification range, fast sample exchange, and the ability to accommodate large specimen

•Variable accelerating voltage to control beam damage, optimize characterization conditions

•Secondary and backscattered electron imaging

Key Configuration Parameters

•Benchtop configuration

•Easy-to-use software interface with auto start, focus, and brightness/contrast

•secondary electron imaging, and directional backscattered imaging via 4-segment detector

•5/15kV accelerating voltage

•15-30,000x magnification

•Max sample dimensions: f 70mm, height of 50mm

•Low-vacuum mode for charge dissipation