Scanning Electron Microscope
Hitachi SU7000 Scanning Electron Microscope
Ultra-high-resolution imaging, structural, and compositional analysis
Key Functionalities
•Ultra-high-resolution imaging, structural and compositional analysis
•Multi-channel imaging capability allowing for correlated acquisition of structural, topographic, compositional, crystallographic, and other types of information
•Variable-pressure capability for observation of insulating samples
•Energy dispersive X-ray (EDX) analysis and electron backscatter diffraction (EBSD) analysis
•User-friendly SEM interface allows for easy operation
Key Configuration Parameters
•multi-detector configuration; secondary (UD, MD, LD), backscattered, and ultra-variable pressure detectors
•Schottky field-emission electron source for ultra-high-resolution imaging at low and high accelerating voltages AND excellent micro-analysis (EDS, EBSD) performance
•0.1-30 keV accelerating voltage
•5-300 Pa variable pressure range
•Large specimen chamber and large stage (suited for high-volume and specialty applications)
•Automated, motorized stage utilizing integrated camera navigation
•Energy dispersive Xray spectrometer (EDX)
•Electron backscattered diffraction detector (EBSD)
