Transmission Electron Microscope
Hitachi HT7700 Transmission Scanning Electron Microscope
High-resolution structural and compositional information
Key Functionalities
•High-resolution structural and compositional information
•High contrast and high-resolution modes
•Low energy characterization for beam sensitive samples
•STEM capability
•User-friendly software command and control
Key Configuration Parameters
•Fully digital configuration
•Easy-to-use software interface
•Amber 750k direct electron detector, AMT XR280 camera
•Thermionic LaB6 emitter, 0.4-120kV accelerating voltage
•Magnification of 50-600,000x
•BF/DF STEM capability
•High contract/high resolution pole piece with large gap, allowing +/- 70o tilt
•STEM unit (brightfield/darkfield)
