Inverted Metallurgical Microscope
Nikon Eclipse MA200 Inverted Optical Microscopy
High-resolution optical microscopic inspection
Key Functionalities
•Suited to analysis of larger samples
•Can be used to characterize samples where visualization through the bottom of a vessel is required (e.g., due to physical state, settling of material of interest, etc.)
•Brightfield, darkfield, simple polarization, and differential interference contrast microscopy
Important Configuration Parameters
•Inverted configuration
•Bright-field, dark-field, polarized, differential interference contrast microscopy
•TU Plan Fluor BD 5x, 20x, 50x, 100x, CFI TU BD EPI Plan Fluor 10x objectives and 10x/22 eyepiece
•Interfaced to PC with OmniMet Enterprise Image Analysis software
•Digital USB color camera for image capture
