• Expands nanoscale IR to a broad range of real world samples
• New resonance enhanced mode enables nanoscale IR on < 20 nm films
• Rich, interpretable IR spectra
• Powerful, full featured AFM
• Multifunctional measurements including integrated thermal and mechanical property mapping
• Designed and built for productivity and rapid time-to-results

For applications of the technique, please visit the Anasys webpage

“One-stop shopping at the frontiers of material characterisation”