Techniques Employed

At the heart of the Facility are leading edge capabilities in the major techniques for materials characterisation and sample preparation.

Characterization Techniques
  • Electron Spectroscopy
    • X-ray Photoelectron Spectroscopy
    • Auger Electron Spectrosopy
    • UV Photoelectron Spectroscopy
  • Ion Spectroscopy
    • Time-of-Flight Secondary Ion Mass Spectrometry
    • Low Energy Ion Scattering
  • Electron Microscopy
    • Secondary Electron Microscopy
    • Transmission Electron Microscopy
  • Scanning Probe
    • AFM/FTIR
    • Surface profilometry
Sample Manipulation
  • Preparation
    • Fast Ion Bombardment / SEM
    • Bench Top Ion Milling
    • Cryo-ultramicrotome
    • Target Sectioning System
  • Transfer/Chambers
    • Vaccum/cryo “suitcase”
    • In situ preparation chambers / glove box
    • Virtual connection between instruments and chambers

See Instrumentation for further details.

“One-stop shopping at the frontiers of material characterisation”

Ontario Centre for the Characterisation of Advanced Materials