Parallel Imaging XPS

(coming, vendor to be determined)

  • > 3um spatial resolution
  • High energy resolution
  • UV photoelectron spectroscopy
  • Ar cluster ion gun – molecular depth profiling on soft materials
  • Glove box + preparation chamber
  • Heating/cooling
  • Port to allow docking to vacuum/cryo “suitcase”

 

Ontario Centre for the Characterisation of Advanced Materials