OCCAM utilizes various pieces of hardware to allow samples to be moved under controlled conditions (e.g., vacuum, inert atmosphere) between characterization tools, sample preparation equipment, and production origin.
Images of air protection cryo holder for TEM
Gloveboxes
LCTech Personal Workstation (2- and 3-glove)
High-purity oxygen- and moisture-free environments for sample manipulation and transfer
Key Functionalities:
•Specimen preparation and manipulation within a high-purity Ar environment
•Mounting and transfer of samples to/from XPS and ToFSIMS instruments without exposure to ambient atmosphere (transfer to other instruments is possible via sample transfer devices – see below)
Important Configuration Parameters
•High purity Ar environment, with <1ppm O2 and<1ppm moisture
•Directly interfaced to vacuum systems of XPS and ToFSIMS instruments
•Rapid entry antechamber, 6” ID x 15” length
Sample Transfer Devices
Custom Devices
Transfer of specimen within controlled environments between facility infrastructure and user labs
Key Functionalities:
•Transfer of samples under controlled conditions between analytical instruments and appropriately interfaced user hardware
•Transfer of samples under vacuum, pressurized inert gas, temperature-controlled conditions (select tools)
•Enabling characterization of sensitive samples, multi-technique and correlative characterization (select tool combinations)
Important Configuration Parameters
•Hardware interfaced to various sample preparation/manipulation tools (e.g.cryo-ultramicrotome, focused ion beam system) and analytical tools (e.g., XPS, ToFSIMS, SAM)
•Transfer devices of various dimension to allow facile movement of samples to e.g., user glovebox
•Devices designed to accommodate direct transfer of samples between select tools without sample dismounting
•Active sample pumping available for some tools
Sample Modification and Perturbation
Sample Treatment and Perturbation
Integrated Sample Treatment and Modifications
Perturbation of samples in-situ and during characterization, including heating and cooling, gas-dosing, photon exposure, and electronic manipulations
Key Functionalities:
•In-situ sample heating, sample cooling, gas dosing, photon exposure, sample fracture
•Integrated chamber ‘bolt-on’ capacity for specialty applications, including direct interfacing of preparation environments and chambers to analytical infrastructure
Important Configuration Parameters
•Systems are designed for flexible and functional applications for various applications
•Many systems are capable of multi-instrument connectivity and transfer, allowing for correlative characterization
XPS Sample Treatment
SIMS Sample Treatment
LEIS Sample Treatment
TEM Sample Treatment
