Instrumentation

OCCAM is greater than the sum of its two halves due to the synergy that is created when two leading edge facilities in spectroscopy and microscopy come together. The following state-of-the-art equipment is available to all researchers in both academia and industry.

Electron Spectroscopy
Scanning Probe Microscopy
  • Anasys nanoIR (coming)
    • Combined AFM/IR
  • KLA Tencor P16A Stylus Profiliometer
Sample Manipulation
  • Leica EM UC6/FC Cryo-Ultramicrotome
  • Leica EM TXP Target Sectioning System
  • Vacuum/Cryo “Suitcase”
    • Virtual connection between chambers
Ion Spectroscopy

Electron Microscopy
  • Hitachi CFE-TEM HF3300
    • Environmental TEM
    • Nano diffraction
    • Spatially resolved EELS
    • High pressure SE detector
    • In situ TEM/STEM/SEM
  • Hitachi VP-SEM SU3500
    • Variable pressure SEM
    • EDX
  • Hitachi UHR-SEM SU8230
    • Ultra-high resolution SEM
    • SE/BSE/STEM
    • EDX – high speed mapping
  • Hitachi HR-SEM S4500
Sample Preparation
  • Hitachi Dual-beam FIB-SEM NB5000
    • Focused Ion (Ga) and e-beam system
    • TEM/STEM/SEM sample preparation
    • Ease of transfer to TEM
  • Hitachi Ion milling system IM4000
    • “Poor Man’s FIB”
  • Polishing equipment

Please click on names for more details

“One-stop shopping at the frontiers of material characterisation”

Ontario Centre for the Characterisation of Advanced Materials