OCCAM Instrumentation and Equipment

Electron Spectroscopy
Scanning Probe Microscopy
  • Anasys nanoIR
    • Combined AFM/IR
  • KLA Tencor P16A Stylus Profiliometer
Sample Manipulation
  • Leica EM UC6/FC Cryo-Ultramicrotome
  • Leica EM TXP Target Sectioning System
  • Vacuum/Cryo “Suitcase”
    • Virtual connection between chambers
Ion Spectroscopy

Electron Microscopy
Sample Preparation
  • Hitachi Dual-beam FIB-SEM NB5000
    • Focused Ion (Ga) and e-beam system
    • TEM/STEM/SEM sample preparation
    • Ease of transfer to TEM
  • Hitachi Ion milling system IM4000
    • “Poor Man’s FIB”
  • Polishing equipment

Please click on names for more details

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Open Centre for the Characterisation of Advanced Materials